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2012 |
Research Area |
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Anzalee Khan, PhD: New Investigator Award Recipient Yavorsky C, Khan A, Rothman B, Liechti S, DiClemente G, Opler M, Jovic S. A Rasch Model analysis to assess cross-cultural differences among items of the Positive and Negative Syndrome Scale (PANSS). click here to view award. |
Psychometrics |
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Brian Rothman, PhD: Travel Award Recipient click here to view award. |
Mental Health |
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Poster Award Nomination: click here to view award. |
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2011 |
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Anzalee Khan, PhD: Young Investigator Award Recipient click here to view award.
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Psychometrics |
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Best Poster Award: Yavorsky C, Khan A, Liechti S, DiClemente G, DeFries A, Opler M, Jovic S. A Rasch model analysis to assess cross-cultural differences among items of the Positive and Negative Syndrome Scale (PANSS) in Schizophrenia. CNS Summit, Boca Raton, FL, 2011
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Global Cultural Issues |